In situ characterization of nanoscale strains in loaded whole joints via synchrotron X-ray tomography

Madi, K; Staines, K A; Bay, B K; Javaheri, B; Geng, H; Bodey, A J; Cartmell, S; Pitsillides, A A; Lee, P D

doi:10.1038/s41551-019-0477-1

In situ characterization of nanoscale strains in loaded whole joints via synchrotron X-ray tomography

Madi, K; Staines, K A; Bay, B K; Javaheri, B; Geng, H; Bodey, A J; Cartmell, S; Pitsillides, A A; Lee, P D

Authors

K Madi

K A Staines

B K Bay

B Javaheri

H Geng

A J Bodey

S Cartmell

A A Pitsillides

P D Lee

Citation

Madi, K., Staines, K. A., Bay, B. K., Javaheri, B., Geng, H., Bodey, A. J., …Lee, P. D. (2019). In situ characterization of nanoscale strains in loaded whole joints via synchrotron X-ray tomography. https://doi.org/10.1038/s41551-019-0477-1

Journal Article Type	Article
Acceptance Date	Oct 11, 2019
Publication Date	Nov 25, 2019
Deposit Date	Nov 29, 2019
Publicly Available Date	May 22, 2020
Journal	Nature Biomedical Engineering
Peer Reviewed	Peer Reviewed
DOI	https://doi.org/10.1038/s41551-019-0477-1
Public URL	https://rvc-repository.worktribe.com/output/1379648